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Commenced in January 2007 Frequency: Monthly Edition: International Publications Count: 29527


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9642
Off-State Leakage Power Reduction by Automatic Monitoring and Control System
Abstract:
This paper propose a new circuit design which monitor total leakage current during standby mode and generates the optimal reverse body bias voltage, by using the adaptive body bias (ABB) technique to compensate die-to-die parameter variations. Design details of power monitor are examined using simulation framework in 65nm and 32nm BTPM model CMOS process. Experimental results show the overhead of proposed circuit in terms of its power consumption is about 10 μW for 32nm technology and about 12 μW for 65nm technology at the same power supply voltage as the core power supply. Moreover the results show that our proposed circuit design is not far sensitive to the temperature variations and also process variations. Besides, uses the simple blocks which offer good sensitivity, high speed, the continuously feedback loop.
Digital Object Identifier (DOI):

References:

[1] N. Mehta, B. Amrutur, and P. M. Grant, "Dynamic supply and threshold voltage scaling for CMOS digital circuits using in-situ power monitor (Periodical styleÔÇöAccepted for publication)," IEEE Transactions on very large scale integration (VLSI) systems, to be published.
[2] H. Xu, W. Jone, and R. Vemuri "Aggressive runtime leakage control through adaptive light-weight vth hopping with temperature and process variation," IEEE transactions on very large scale integration (VLSI) systems, VOL. 19, NO. 7, pp. 1319-1323, July 2011.
[3] H. Jeon, Y.-Bin Kim and M. Choi "Standby leakage power reduction technique for nanoscale CMOS VLSI systems," IEEE Transactons instrumentation and measurment, Vol. 59, No. 5, May 2010.
[4] N. Mehta, G. Naik, and B.Amrutur, "In-situ power monitoring scheme and its application in dynamic voltage and threshold scaling for digital cmos integrated circuits," ISLPED-10, pp. 259-264, August 2010.
[5] A. Sanyal, A. Rastogi, W. Chen, and S. Kundu, "An efficient technique for leakage current estimation in nanoscaled cmos circuits incorporating self-loading effects," IEEE Transactions on computers, VOL. 59, NO. 7, pp. 922-932, July 2010
[6] M. Raymond, M. Ghoneima and Y. Ismail, "A dynamic power-aware process variation calibration scheme," supported by the middle east energy efficiency center - Intel, IEEE, 2010.
[7] H. Jeon, Y.-B. Kim, and M. Choi, "A novel technique to minimize standby leakage power in nanoscale CMOS VLSI," In Proc. I2MTC, Singapore, May 5-7, 2009, pp. 1372-1375.
[8] K. K. Kim and Y.-B. Kim, "A novel adaptive design methodology for minimum leakage power considering pvt variations on nanoscale VLSI systems," IEEE Trans. Very Large Scale Integr. (VLSI) Syst., Vol. 17, No. 4, pp. 517-528, Apr. 2009.
[9] H. Mostafa, M. Anis, and M. Elmasry, "Comparative analysis of timing yield improvement under process variations of flip-flops circuits," IEEE Computer society annual symposium on VLSI, pp. 133- 138, 2009.
[10] M. Fujii, H. Suzuki, H. Notani, H. Makino and H. Shinohara, "On-chip leakage monitor circuit to scan optimal reverse bias voltage for adaptive body-bias circuit under gate induced drain leakage effect," IEEE, pp. 258-261, 2008.
[11] J. Hong Yang, G. Fang Li, and H. Lan Liu, "Off state leakage current in nanoscale mosfet with HF-based gate dielectrics," IEEE International nanoelectronics conference. 2008.
[12] K. K. Kim and Y.-B. Kim, "Optimal body biasing for minimum leakage power in standby mode," IEEE, pp. 1161-1164, 2007.
[13] K. Ki Kim, Y.Bin Kim, N. Park, and M. Choi, "Leakage minimization technique for nanoscale CMOS VLSI," IEEE Computer-Aided Design for Emerging Technologies. pp. 322- 330, 2007.
[14] G. Thakral, S. P. Mohanty, D. Ghai, and D. K. Pradhan, "P3 (powerperformance- process) optimization of nano-CMOS SRAM using statistical DOE-ILP," supported in part by NSF awards CCF-0702361 and CNS-0854182, IEEE, 2010.
[15] K. Roy, S. Mukhopadhyay, and H. Mahmoodi-Meimand, "Leakage current mechanisms and leakage reduction techniques in deep submicrometer CMOS circuits," Proc. IEEE, Vol. 91, No. 2, pp. 305-327, Feb. 2003.
[16] C. Neau and K. Roy, "Optimal body bias selection for leakage improvement and process compensation over different technology generations," in Proc. ISLEP, Aug. 2003, pp. 116-121.
[17] J. Tschanz, J. Kao, S. Narendra, R. Nair, D. Antoniadis, A. Chandrakasan, and V. De, "Adaptive body bias for reducing impacts of die-to-die and within-die parameter variations on microprocessor frequency and leakage," in Proc. ISSCC, 2002, pp. 786-789.
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