Open Science Research Excellence
Fadlallah, M. ; Ghibaudo, G. ; Theodorou, C. (2018), 'Dynamic Variation in Nano-Scale CMOS SRAM Cells Due to LF/RTS Noise and Threshold Voltage ', World Academy of Science, Engineering and Technology, International Science Index 139, International Journal of Electrical, Computer, Energetic, Electronic and Communication Engineering, 12(7), 506 - 509.