Open Science Research Excellence
M. Fadlallah and  G. Ghibaudo and  C. G. Theodorou,  Dynamic Variation in Nano-Scale CMOS SRAM Cells Due to LF/RTS Noise and Threshold Voltage .   journal   = {International Journal of Electrical, Computer, Energetic, Electronic and Communication Engineering}, [online]. World Academy of Science, Engineering and Technology. July 2018, vol. 139(7). 506 - 509[viewed 19 February 2019]. Available from: http://waset.org/publications/10009262.