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Kim, S. , Park, C. , Choi, Y. , Kwon, S. , Kweon, I.. "Feature Point Detection by Combining Advantages of Intensity-based Approach and Edge-based Approach". World Academy of Science, Engineering and Technology, International Science Index 68, International Journal of Computer, Electrical, Automation, Control and Information Engineering (2012), 6(8), 1055 - 1060.