Open Science Research Excellence
Bhuyan, M. ; Mohammedy, F. ; Khosru, Q. (2011), 'Doping Profile Measurement and Characterization by Scanning Capacitance Microscope for PocketImplanted Nano Scale n-MOSFET', World Academy of Science, Engineering and Technology, International Science Index 56, International Journal of Electrical, Computer, Energetic, Electronic and Communication Engineering, 5(8), 1082 - 1089.