Open Science Research Excellence
Kang, C. ; Im, I. ; Churayev, S. ; Paltashev, T. (2011), 'Phase Error Accumulation Methodology for On-Chip Cell Characterization', World Academy of Science, Engineering and Technology, International Science Index 55, International Journal of Electrical, Computer, Energetic, Electronic and Communication Engineering, 5(7), 797 - 800.