Open Science Research Excellence
@article{(International Science Index):http://waset.org/publications/4231,
  title    = {Least Square-SVM Detector for Wireless BPSK in Multi-Environmental Noise},
  author    = {J. P. Dubois and  Omar M. Abdul-Latif},
  country   = {},
  institution={},
  abstract  = {Support Vector Machine (SVM) is a statistical
learning tool developed to a more complex concept of
structural risk minimization (SRM). In this paper, SVM is
applied to signal detection in communication systems in the
presence of channel noise in various environments in the form
of Rayleigh fading, additive white Gaussian background noise
(AWGN), and interference noise generalized as additive color
Gaussian noise (ACGN). The structure and performance of
SVM in terms of the bit error rate (BER) metric is derived and
simulated for these advanced stochastic noise models and the
computational complexity of the implementation, in terms of
average computational time per bit, is also presented. The
performance of SVM is then compared to conventional binary
signaling optimal model-based detector driven by binary
phase shift keying (BPSK) modulation. We show that the
SVM performance is superior to that of conventional matched
filter-, innovation filter-, and Wiener filter-driven detectors,
even in the presence of random Doppler carrier deviation,
especially for low SNR (signal-to-noise ratio) ranges. For
large SNR, the performance of the SVM was similar to that of
the classical detectors. However, the convergence between
SVM and maximum likelihood detection occurred at a higher
SNR as the noise environment became more hostile.},
    journal   = {International Journal of Electrical, Computer, Energetic, Electronic and Communication Engineering},  volume    = {2},
  number    = {8},
  year      = {2008},
  pages     = {1692 - 1697},
  ee        = {http://waset.org/publications/4231},
  url       = {http://waset.org/Publications?p=20},
  bibsource = {http://waset.org/Publications},
  issn      = {eISSN:1307-6892},
  publisher = {World Academy of Science, Engineering and Technology},
  index     = {International Science Index 20, 2008},
}