Open Science Research Excellence
J. Prakash and  K. Rajesh,  Elliptical Features Extraction Using Eigen Values of Covariance Matrices, Hough Transform and Raster Scan Algorithms.   journal   = {International Journal of Computer, Electrical, Automation, Control and Information Engineering}, [online]. World Academy of Science, Engineering and Technology. June 2007, vol. 6(6). 1612 - 1617[viewed 25 March 2019]. Available from: http://waset.org/publications/4671.