Open Science Research Excellence
Ki-Young Kim and  Jae-Ho Lim and  Deok-Min Kim and  Seok-Yoon Kim,  Average Current Estimation Technique for Reliability Analysis of Multiple Semiconductor Interconnects.   journal   = {International Journal of Computer, Electrical, Automation, Control and Information Engineering}, [online]. World Academy of Science, Engineering and Technology. November 2010, vol. 47(11). 1683 - 1687[viewed 16 February 2019]. Available from: