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Jieer Wu and  Zheshu Ma,  On Method of Fundamental Solution for Nondestructive Testing.   journal   = {International Journal of Mathematical, Computational, Physical, Electrical and Computer Engineering}, [online]. World Academy of Science, Engineering and Technology. August 2012, vol. 68(8). 983 - 986[viewed 17 October 2017]. Available from: http://waset.org/publications/5950.