Open Science Research Excellence
%0 Journal Article
%A Mayank Shakya and  Soundra Pandian. K. K
%D 2009 
%J  International Journal of Electrical, Computer, Energetic, Electronic and Communication Engineering
%B World Academy of Science, Engineering and Technology
%I International Science Index 34, 2009
%T A Power Reduction Technique for Built-In-Self Testing Using Modified Linear Feedback Shift Register
%V 34
%X A linear feedback shift register (LFSR) is proposed which targets to reduce the power consumption from within. It reduces the power consumption during testing of a Circuit Under Test (CUT) at two stages. At first stage,
Control Logic (CL) makes the clocks of the switching units
of the register inactive for a time period when output from
them is going to be same as previous one and thus reducing
unnecessary switching of the flip-flops. And at second stage,
the LFSR reorders the test vectors by interchanging the bit
with its next and closest neighbor bit. It keeps fault coverage
capacity of the vectors unchanged but reduces the Total Hamming Distance (THD) so that there is reduction in power
while shifting operation.
%P 1893 - 1896