Open Science Research Excellence
Hee Suk Seo and  Tae Kyung Kim,  DEVS Modeling of Network Vulnerability.   journal   = {International Journal of Electrical, Computer, Energetic, Electronic and Communication Engineering}, [online]. World Academy of Science, Engineering and Technology. December 2007, vol. 12(12). 1772 - 1775[viewed 22 May 2019]. Available from: http://waset.org/publications/7155.