Open Science Research Excellence
@article{(International Science Index):,
  title    = {Design for Reliability and Manufacturing Yield (Study and Modeling of Defects in Integrated Circuits for their Reliability Analysis)},
  author    = {G. Ait Abdelmalek and  R. Ziani},
  country   = {},
  abstract  = {In this document, we have proposed a robust
conceptual strategy, in order to improve the robustness against the manufacturing defects and thus the reliability of logic CMOS circuits. However, in order to enable the use of future CMOS
technology nodes this strategy combines various types of design:
DFR (Design for Reliability), techniques of tolerance: hardware
redundancy TMR (Triple Modular Redundancy) for hard error
tolerance, the DFT (Design for Testability. The Results on largest ISCAS and ITC benchmark circuits show that our approach improves
considerably the reliability, by reducing the key factors, the area costs and fault tolerance probability.},
    journal   = {International Journal of Mechanical, Aerospace, Industrial, Mechatronic and Manufacturing Engineering},  volume    = {6},
  number    = {11},
  year      = {2012},
  pages     = {2496 - 2499},
  ee        = {},
  url       = {},
  bibsource = {},
  issn      = {eISSN:1307-6892},
  publisher = {World Academy of Science, Engineering and Technology},
  index     = {International Science Index 71, 2012},