Open Science Research Excellence
Abdelmalek, G. ; Ziani, R. (2012), 'Design for Reliability and Manufacturing Yield (Study and Modeling of Defects in Integrated Circuits for their Reliability Analysis)', World Academy of Science, Engineering and Technology, International Science Index 71, International Journal of Mechanical, Aerospace, Industrial, Mechatronic and Manufacturing Engineering, 6(11), 2496 - 2499.