Open Science Research Excellence
G. Ait Abdelmalek and  R. Ziani,  Design for Reliability and Manufacturing Yield (Study and Modeling of Defects in Integrated Circuits for their Reliability Analysis).   journal   = {International Journal of Mechanical, Aerospace, Industrial, Mechatronic and Manufacturing Engineering}, [online]. World Academy of Science, Engineering and Technology. November 2012, vol. 71(11). 2496 - 2499[viewed 21 February 2019]. Available from: