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@article{(International Science Index):http://waset.org/publications/9996851,
  title    = {Static and Dynamic Characteristics of an Appropriated and Recessed n-GaN/AlGaN/GaN HEMT},
  author    = {A. Hamdoune and  M. Abdelmoumene and  A. Hamroun},
  country   = {Algeria},
  institution={University of Abou-Bakr Belkaid},
  abstract  = {The objective of this paper is to simulate static I-V and dynamic characteristics of an appropriated and recessed n-GaN/AlxGa1-xN/GaN high electron mobility (HEMT). Using SILVACO TCAD device simulation, and optimized technological parameters; we calculate the drain-source current (lDS) as a function of the drain-source voltage (VDS) for different values ​​of the gate-source voltage (VGS), and the drain-source current (lDS) depending on the gate-source voltage (VGS) for a drain-source voltage (VDS) of 20 V, for various temperatures. Then, we calculate the cut-off frequency and the maximum oscillation frequency for different temperatures.

We obtain a high drain-current equal to 60 mA, a low knee voltage (Vknee) of 2 V, a high pinch-off voltage (VGS0) of 53.5 V, a transconductance greater than 600 mS/mm, a cut-off frequency (fT) of about 330 GHz, and a maximum oscillation frequency (fmax) of about 1 THz.
},
    journal   = {International Journal of Electrical, Computer, Energetic, Electronic and Communication Engineering},  volume    = {7},
  number    = {1},
  year      = {2013},
  pages     = {96 - 100},
  ee        = {http://waset.org/publications/9996851},
  url       = {http://waset.org/Publications?p=73},
  bibsource = {http://waset.org/Publications},
  issn      = {eISSN:1307-6892},
  publisher = {World Academy of Science, Engineering and Technology},
  index     = {International Science Index 73, 2013},
}