Open Science Research Excellence
Setekera, R. , Tiemeijer, L. , Toorn, R.. "Verification of the Simultaneous Local Extraction Method of Base and Thermal Resistance of Bipolar Transistors". World Academy of Science, Engineering and Technology, International Science Index 94, International Journal of Electrical, Computer, Energetic, Electronic and Communication Engineering (2014), 8(10), 1551 - 1555.