Test data compression is an efficient method for reducing the test application cost. The problem of reducing test data has been addressed by researchers in three different aspects: Test Data Compression, Built-in-Self-Test (BIST) and Test set compaction. The latter two methods are capable of enhancing fault coverage with cost of hardware overhead. The drawback of the conventional methods is that they are capable of reducing the test storage and test power but when test data have redundant length of runs, no additional compression method is followed. This paper presents a modified Run Length Coding (RLC) technique with Multilevel Selective Huffman Coding (MLSHC) technique to reduce test data volume, test pattern delivery time and power dissipation in scan test applications where redundant length of runs is encountered then the preceding run symbol is replaced with tiny codeword. Experimental results show that the presented method not only improves the test data compression but also reduces the overall test data volume compared to recent schemes. Experiments for the six largest ISCAS-98 benchmarks show that our method outperforms most known techniques.
The fault tolerant system plays a crucial role in the critical applications which are being used in the present scenario. A fault may change the functionality of circuits. Aim of this paper is to design multiplier using fault tolerant hybrid full adder. Fault tolerant hybrid full adder is designed to check and repair any fault in the circuit using self-checking circuit and the self-repairing circuit. Further, the use of conventional logic circuits may result in more area, delay as well as power consumption. In order to reduce these parameters of the circuit, GDI (Gate Diffusion Input) techniques with less number of transistors are used compared to conventional full adder circuit. This reduces the area, delay and power consumption. The proposed method solves the major problems occurring in the most crucial and critical applications.