Scholarly Research Excellence

ICOSPTS 2019 : 21st International Conference on Optical Signal Processing Techniques and Software

Buenos Aires, Argentina
February 27 - 28, 2019

Conference Code: 19AR02ICOSPTS

Conference Proceedings

All submitted conference papers will be blind peer reviewed by three competent reviewers. The peer-reviewed conference proceedings are indexed in the Digital Open Science Index, Google Scholar, Semantic Scholar, Zenedo, OpenAIRE, BASE, WorldCAT, Sherpa/RoMEO, and other index databases. Impact Factor Indicators.

Special Journal Issues

ICOSPTS 2019 has teamed up with the Special Journal Issue on Optical Signal Processing Techniques and Software. A number of selected high-impact full text papers will also be considered for the special journal issues. All submitted papers will have the opportunity to be considered for this Special Journal Issue. The paper selection will be carried out during the peer review process as well as at the conference presentation stage. Submitted papers must not be under consideration by any other journal or publication. The final decision for paper selection will be made based on peer review reports by the Guest Editors and the Editor-in-Chief jointly. Selected full-text papers will be published online free of charge.

Conference Sponsor and Exhibitor Opportunities

The Conference offers the opportunity to become a conference sponsor or exhibitor. To participate as a sponsor or exhibitor, please download and complete the Conference Sponsorship Request Form.

Important Dates

Abstracts/Full-Text Paper Submission Deadline   December 31, 2018
Notification of Acceptance/Rejection   January 14, 2019
Final Paper (Camera Ready) Submission & Early Bird Registration Deadline   January 28, 2019
Conference Dates   February 27 - 28, 2019

Important Notes

Please ensure your submission meets the conference's strict guidelines for accepting scholarly papers. Downloadable versions of the check list for Full-Text Papers and Abstract Papers.

Please refer to the Paper Submission GUIDE before submitting your paper.

Selected Conference Papers

1) An Improved K-Means Algorithm for Gene Expression Data Clustering
Billel Kenidra, Mohamed Benmohammed
2) Neuron Efficiency in Fluid Dynamics and Prediction of Groundwater Reservoirs'' Properties Using Pattern Recognition
J. K. Adedeji, S. T. Ijatuyi
3) Automated Heart Sound Classification from Unsegmented Phonocardiogram Signals Using Time Frequency Features
Nadia Masood Khan, Muhammad Salman Khan, Gul Muhammad Khan
4) A Neural Network Classifier for Estimation of the Degree of Infestation by Late Blight on Tomato Leaves
Gizelle K. Vianna, Gabriel V. Cunha, Gustavo S. Oliveira
5) Image Rotation Using an Augmented 2-Step Shear Transform
Hee-Choul Kwon, Heeyong Kwon
6) Clustering Categorical Data Using the K-Means Algorithm and the Attribute’s Relative Frequency
Semeh Ben Salem, Sami Naouali, Moetez Sallami
7) A Computational Cost-Effective Clustering Algorithm in Multidimensional Space Using the Manhattan Metric: Application to the Global Terrorism Database
Semeh Ben Salem, Sami Naouali, Moetez Sallami
8) A Neuro-Automata Decision Support System for the Control of Late Blight in Tomato Crops
Gizelle K. Vianna, Gustavo S. Oliveira, Gabriel V. Cunha
9) Input Data Balancing in a Neural Network PM-10 Forecasting System
Suk-Hyun Yu, Heeyong Kwon
10) An Integrated Cognitive Performance Evaluation Framework for Urban Search and Rescue Applications
Antonio D. Lee, Steven X. Jiang
11) Disaggregating and Forecasting the Total Energy Consumption of a Building: A Case Study of a High Cooling Demand Facility
Juliana Barcelos Cordeiro, Khashayar Mahani, Farbod Farzan, Mohsen A. Jafari
12) Statistical Wavelet Features, PCA, and SVM Based Approach for EEG Signals Classification
R. K. Chaurasiya, N. D. Londhe, S. Ghosh
13) A Pattern Recognition Neural Network Model for Detection and Classification of SQL Injection Attacks
Naghmeh Moradpoor Sheykhkanloo
14) A Neural Approach for the Offline Recognition of the Arabic Handwritten Words of the Algerian Departments
Salim Ouchtati, Jean Sequeira, Mouldi Bedda
15) Pattern Recognition Using Feature Based Die-Map Clusteringin the Semiconductor Manufacturing Process
Seung Hwan Park, Cheng-Sool Park, Jun Seok Kim, Youngji Yoo, Daewoong An, Jun-Geol Baek

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