The International Research Conference Aims and Objectives
The International Research Conference is a federated organization dedicated to bringing together a significant number of diverse scholarly events for presentation
within the conference program. Events will run over a span of time during the conference depending on the number and length of the presentations.
With its high quality, it provides an exceptional value for students, academics and industry researchers.
International Conference on Metrology and Inspection
aims to bring together leading academic scientists, researchers and research scholars to exchange and share their experiences and research results on all aspects of
Metrology and Inspection.
It also provides a premier interdisciplinary platform for researchers, practitioners and educators to present and discuss the most recent innovations,
trends, and concerns as well as practical challenges encountered and solutions adopted in the fields of Metrology and Inspection.
Call for Contributions
Prospective authors are kindly encouraged to contribute to and help shape the conference through submissions of their research abstracts, papers and e-posters.
Also, high quality research contributions describing original and unpublished results of conceptual, constructive, empirical, experimental, or
theoretical work in all areas of Metrology and Inspection are cordially invited for presentation at the conference.
The conference solicits contributions of abstracts, papers and e-posters that address themes and topics of the conference, including figures, tables and references of
novel research materials.
Guidelines for Authors
Please ensure your submission meets the conference's strict guidelines for accepting scholarly papers.
Downloadable versions of the check list for
Full-Text Papers and
Abstract Papers.
Please refer to the
Paper Submission Guideline,
Abstract Submission Guideline and
Author Information
before submitting your paper.
Conference Proceedings
All submitted conference papers will be blind peer reviewed by three competent reviewers.
The peer-reviewed conference proceedings are indexed in the Open Science Index,
Google Scholar,
Semantic Scholar,
Zenedo,
BASE,
WorldCAT,
Sherpa/RoMEO,
and other index databases. Impact Factor Indicators.
Special Journal Issues
21. International Conference on Metrology and Inspection has teamed up with the Special Journal Issue on
Metrology and Inspection.
A number of selected high-impact full text papers will also be considered for the special journal issues.
All submitted papers will have the opportunity to be considered for this Special Journal Issue.
The paper selection will be carried out during the peer review process as well as at the conference presentation stage.
Submitted papers must not be under consideration by any other journal or publication.
The final decision for paper selection will be made based on peer review reports by the Guest Editors and the Editor-in-Chief jointly.
Selected full-text papers will be published online free of charge.
Conference Sponsor and Exhibitor Opportunities
The Conference offers the opportunity to become a conference sponsor or exhibitor.
To participate as a sponsor or exhibitor, please download and complete the
Conference Sponsorship Request Form.
Selected Papers
-
Study of Deep Learning-Based Model for Recognizing Human Activities in IoT Applications
Tarunima Chatterjee, Pinaki Pratim Acharjya
-
Analysis of the Cost-Benefits of Solar Energy Adoption in Urban and Rural Settings
Chibuzo Emeruwa, Raymond C. Abenga
-
Developing a Spatial Transport Model to Determine Optimal Routes When Delivering Unprocessed Milk
Sunday Nanosi Ndovi, Patrick Albert Chikumba
-
Urban Logistics Dynamics: A User-Centric Approach to Traffic Modeling and Kinetic Parameter Analysis
Emilienne Lardy, Eric Ballot, Mariam Lafkihi
-
Synchronization of Bus Frames during USB Transfer
Petr Šimek
-
“Bring Your Own Device” Security Model in a Financial Institution of South Africa
Michael Nthabiseng Moeti, Makhulu Relebogile Langa, Joey Jansen van Vuuren
-
Sustainable Manufacturing of Solenoid Valve Housing in Fiji: Fused Deposition Modeling and Emergy Analysis
M. Hisham, S. Cabemaiwai, S. Prasad, T. Dauvakatini, R. Ananthanarayanan
-
Research on the Landscape of Xi'an Ancient City Based on the Poetry Text of Tang Dynasty
Zou Yihui
-
On the Resilience of Operational Technology Devices in Penetration Tests
Florian Kessels, Niklas Reitz, Marko Schuba
-
Analysis and Prediction of Decadal Hydrological Cycles: A Case Study of the Limpopo River Basin
Fulufhelo Khangale, Ednah Onyari, Idowu Bodunrin
-
Development of a Low-Cost Smart Insole for Gait Analysis
S. M. Khairul Halim, Mojtaba Ghodsi, Morteza Mohammadzaheri
-
Strengthening Strategy Across Languages: A Cognitive and Grammatical Universal Phenomenon
Behnam Jay
-
A Crowdsourced Homelessness Data Collection System and Its Econometric Analysis: Strengthening Inclusive Public Administration Policies
Praniil Nagaraj
-
SynKit: A Event-Driven and Scalable Microservices-Based Kitting System
Bruno Nascimento, Cristina Wanzeller, Jorge Silva, João A. Dias, André Barbosa, José Ribeiro
-
Research on Pollutant Characterization and Timing Decomposition in Beijing During 2018-2022
Gao Fangting
Conference venue information will be released soon.
Measurement, analysis and testing processes and technologies
Evolution of techniques, advances in R&D and industrial applications
Metrology and precious measurement
Jigs and fixtures
Surface finish measurement
Linear and different angular measurement
Alignment testing of machine tools
Measurement, analysis and testing processes
Uncertainties, traceability
Inter-laboratory comparisons
Calibration
Verification
Training
Cost optimization
Certification
Metrology function
Measurement technics
Mass, force, flow and pressure
Dimensional, electricity
Time-frequency
Temperature
Hygrometry
Optics and photonics
Ionizing radiation
Acoustics
Chemical measures
Biological measures
Abstracts/Full-Text Paper Submission Deadline |
|
February 13, 2026 |
Notification of Acceptance/Rejection |
|
February 27, 2026 |
Final Paper (Camera Ready) Submission & Early Bird Registration Deadline |
|
July 12, 2027 |
Conference Dates |
|
November 11-12, 2027 |