The International Research Conference Aims and Objectives
The International Research Conference is a federated organization dedicated to bringing together a significant number of diverse scholarly events for presentation
within the conference program. Events will run over a span of time during the conference depending on the number and length of the presentations.
With its high quality, it provides an exceptional value for students, academics and industry researchers.
International Conference on Electronic Measurement and Instruments
aims to bring together leading academic scientists, researchers and research scholars to exchange and share their experiences and research results on all aspects of
Electronic Measurement and Instruments.
It also provides a premier interdisciplinary platform for researchers, practitioners and educators to present and discuss the most recent innovations,
trends, and concerns as well as practical challenges encountered and solutions adopted in the fields of Electronic Measurement and Instruments.
Call for Contributions
Prospective authors are kindly encouraged to contribute to and help shape the conference through submissions of their research abstracts, papers and e-posters.
Also, high quality research contributions describing original and unpublished results of conceptual, constructive, empirical, experimental, or
theoretical work in all areas of Electronic Measurement and Instruments are cordially invited for presentation at the conference.
The conference solicits contributions of abstracts, papers and e-posters that address themes and topics of the conference, including figures, tables and references of
novel research materials.
Guidelines for Authors
Please ensure your submission meets the conference's strict guidelines for accepting scholarly papers.
Downloadable versions of the check list for
Full-Text Papers and
Abstract Papers.
Please refer to the
Paper Submission Guideline,
Abstract Submission Guideline and
Author Information
before submitting your paper.
Conference Proceedings
All submitted conference papers will be blind peer reviewed by three competent reviewers.
The peer-reviewed conference proceedings are indexed in the Open Science Index,
Google Scholar,
Semantic Scholar,
Zenedo,
BASE,
WorldCAT,
Sherpa/RoMEO,
and other index databases. Impact Factor Indicators.
Special Journal Issues
20. International Conference on Electronic Measurement and Instruments has teamed up with the Special Journal Issue on
Electronic Measurement and Instruments.
A number of selected high-impact full text papers will also be considered for the special journal issues.
All submitted papers will have the opportunity to be considered for this Special Journal Issue.
The paper selection will be carried out during the peer review process as well as at the conference presentation stage.
Submitted papers must not be under consideration by any other journal or publication.
The final decision for paper selection will be made based on peer review reports by the Guest Editors and the Editor-in-Chief jointly.
Selected full-text papers will be published online free of charge.
Conference Sponsor and Exhibitor Opportunities
The Conference offers the opportunity to become a conference sponsor or exhibitor.
To participate as a sponsor or exhibitor, please download and complete the
Conference Sponsorship Request Form.
Selected Papers
-
Dental Students’ Attitude towards Problem-Based Learning before and after Implementing 3D Electronic Dental Models
Hai Ming Wong, Kuen Wai Ma, Lavender Yu Xin Yang, Yanqi Yang
-
A Study on the Application of Machine Learning and Deep Learning Techniques for Skin Cancer Detection
Hritwik Ghosh, Irfan Sadiq Rahat, Sachi Nandan Mohanty, J. V. R. Ravindra, Abdus Sobur
-
Advanced Convolutional Neural Network Paradigms-Comparison of VGG16 with Resnet50 in Crime Detection
Taiwo. M. Akinmuyisitan, John Cosmas
-
Emerging Technology for 6G Networks
Yaseein S. Hussein, Victor P. Gil Jiménez, Abdulmajeed Al-Jumaily
-
Cyber Fraud Schemes: Modus Operandi, Tools and Techniques, and the Role of European Legislation as a Defense Strategy
Papathanasiou Anastasios, Liontos George, Liagkou Vasiliki, Glavas Euripides
-
A Machine Learning Approach for Earthquake Prediction in Various Zones Based on Solar Activity
Viacheslav Shkuratskyy, Aminu Bello Usman, Michael O’Dea, Mujeeb Ur Rehman, Saifur Rahman Sabuj
-
Accelerating Quantum Chemistry Calculations: Machine Learning for Efficient Evaluation of Electron-Repulsion Integrals
Nishant Rodrigues, Nicole Spanedda, Chilukuri K. Mohan, Arindam Chakraborty
-
Assisted Prediction of Hypertension Based on Heart Rate Variability and Improved Residual Networks
Yong Zhao, Jian He, Cheng Zhang
-
Latency-Based Motion Detection in Spiking Neural Networks
Mohammad Saleh Vahdatpour, Yanqing Zhang
-
Unveiling the Mathematical Essence of Machine Learning: A Comprehensive Exploration
Randhir Singh Baghel
-
A Comparison between Artificial Neural Network Prediction Models for Coronal Hole Related High-Speed Streams
Rehab Abdulmajed, Amr Hamada, Ahmed Elsaid, Hisashi Hayakawa, Ayman Mahrous
-
Evaluation of the Internal Quality for Pineapple Based on the Spectroscopy Approach and Neural Network
Nonlapun Meenil, Pisitpong Intarapong, Thitima Wongsheree, Pranchalee Samanpiboon
-
Analysis of Dropped Call Rate for Long Term Evolution Networks in Bayelsa State, Nigeria
Chibuzo Emeruwa, Nnamdi N. Omehe
-
Experimental Study of Hyperparameter Tuning a Deep Learning Convolutional Recurrent Network for Text Classification
Bharatendra Rai
-
High-Power Amplifier Pre-distorter Based on Neural Networks for 5G Satellite Communications
Abdelhamid Louliej, Younes Jabrane
Conference venue information will be released soon.
Measurement & Test Information Acquisition and Transmission
Sensors and Transducers
Non-electric Measurement
Sensor Network
Data Acquisition System and Technology
Signal Transmission and Data Bus
Networks in Test and Measurement
IOT: Internet of Things
Cyber Physical System
Measurement & Test Information Processing
Sensors Fusion
Signal Analysis and Processing
Image Processing
Measurement System and Theory
Measurement Error Theory
Virtual Measurement
Machine Learning and Pattern Recognition
Intelligent Optimization and Applications
Data Mining
Massive Data Management and Analysis
Modeling and Simulation
Reconfigurable Computing
Measurement, Instruments & Test
Virtual Instrument
Microprocessor and Embedded System
VLSI Testing and Fault Diagnosis
MEMS Instruments and Test System
Testability and Built-in-test
Electronic Instrument & Measurement System
Optical Instrument & Measurement System
Precision Instruments & Measurement System
Scientific Experiment and Analytic Instrument
Educational Instrument & Experimental System
Software Technology
Embedded System Software
Test System Software
Software Test and Reliability
Condition Monitoring and Health Management
System Condition Monitoring
Component and System Reliability
Component and System Fault Diagnosis
Prognostics and Health Management
System Health Management
Calibration and Traceability
Quantum standards to fundamental constants and the international system of units
DC/Low Frequency measurement standards and calibration set
High Frequency measurement standards and calibration set
Calibration for electromagnetic properties of materials
Uncertainty evaluation
International or regional comparison
Instrument & Measurement in Research & Engineering
Simulation and Experimental Technology
Physical, Chemical and Biological Field
Material & Electro-mechanical Engineering
Energy and Power Engineering
Communication Technology
Aerospace & Avionics & Navigation
Automobile Engineering
Environmental Engineering
Biomedical Instrument and Application
Bioassay
Biometric
Industrial Process Control
Robots
Safety Monitoring Instruments and Systems
Abstracts/Full-Text Paper Submission Deadline |
|
February 13, 2025 |
Notification of Acceptance/Rejection |
|
February 27, 2025 |
Final Paper (Camera Ready) Submission & Early Bird Registration Deadline |
|
May 27, 2026 |
Conference Dates |
|
June 28-29, 2026 |