The International Research Conference Aims and Objectives
The International Research Conference is a federated organization dedicated to bringing together a significant number of diverse scholarly events for presentation
within the conference program. Events will run over a span of time during the conference depending on the number and length of the presentations.
With its high quality, it provides an exceptional value for students, academics and industry researchers.
International Conference on Nanotechnology and Nanometrology
aims to bring together leading academic scientists, researchers and research scholars to exchange and share their experiences and research results on all aspects of
Nanotechnology and Nanometrology.
It also provides a premier interdisciplinary platform for researchers, practitioners and educators to present and discuss the most recent innovations,
trends, and concerns as well as practical challenges encountered and solutions adopted in the fields of Nanotechnology and Nanometrology.
Call for Contributions
Prospective authors are kindly encouraged to contribute to and help shape the conference through submissions of their research abstracts, papers and e-posters.
Also, high quality research contributions describing original and unpublished results of conceptual, constructive, empirical, experimental, or
theoretical work in all areas of Nanotechnology and Nanometrology are cordially invited for presentation at the conference.
The conference solicits contributions of abstracts, papers and e-posters that address themes and topics of the conference, including figures, tables and references of
novel research materials.
Guidelines for Authors
Please ensure your submission meets the conference's strict guidelines for accepting scholarly papers.
Downloadable versions of the check list for
Full-Text Papers and
Abstract Papers.
Please refer to the
Paper Submission Guideline,
Abstract Submission Guideline and
Author Information
before submitting your paper.
Conference Proceedings
All submitted conference papers will be blind peer reviewed by three competent reviewers.
The peer-reviewed conference proceedings are indexed in the Open Science Index,
Google Scholar,
Semantic Scholar,
Zenedo,
BASE,
WorldCAT,
Sherpa/RoMEO,
and other index databases. Impact Factor Indicators.
Special Journal Issues
19. International Conference on Nanotechnology and Nanometrology has teamed up with the Special Journal Issue on
Nanotechnology and Nanometrology.
A number of selected high-impact full text papers will also be considered for the special journal issues.
All submitted papers will have the opportunity to be considered for this Special Journal Issue.
The paper selection will be carried out during the peer review process as well as at the conference presentation stage.
Submitted papers must not be under consideration by any other journal or publication.
The final decision for paper selection will be made based on peer review reports by the Guest Editors and the Editor-in-Chief jointly.
Selected full-text papers will be published online free of charge.
Conference Sponsor and Exhibitor Opportunities
The Conference offers the opportunity to become a conference sponsor or exhibitor.
To participate as a sponsor or exhibitor, please download and complete the
Conference Sponsorship Request Form.
Selected Papers
-
Petrology Investigation of Apatite Minerals in the Esfordi Mine, Yazd, Iran
Haleh Rezaei Zanjirabadi, Fatemeh Saberi, Bahman Rahimzadeh, Fariborz Masoudi, Mohammad Rahgosha
-
Application of Voltammetry to Study Corrosion of Steel Buried in Unsaturated Soil in the Presence of Cathodic Protection
Mandlenkosi George Robert Mahlobo, Peter Apata Olubambi, Philippe Refait
-
Investigation and Identification of a Number of Precious and Semi-Precious Stones Related to Bam Historical Citadel Using Micro Raman Spectroscopy and Scanning Electron Microscopy
Nazli Darkhal
-
Microstructural Evolution of an Interface Region in a Nickel-Based Superalloy Joint Produced by Direct Energy Deposition
M. Ferguson, T. Konkova, I. Violatos
-
Developing Manufacturing Process for the Graphene Sensors
Abdullah Faqihi, John Hedley
-
Basic Evaluation for Polyetherimide Membrane Using Spectroscopy Techniques
Hanan Alenezi
-
Influence of Silica Surface Hydrophilicity on Adsorbed Water and Isopropanol Studied by in-situ NMR
Hyung T. Kwak, Jun Gao, Yao An, Alfred Kleinhammes, Yue Wu
-
Effect of Retained Austenite Stability in Corrosion Mechanism of Dual Phase High Carbon Steel
W. Handoko, F. Pahlevani, V. Sahajwalla
-
The Mechanism Study of Degradative Solvent Extraction of Biomass by Liquid Membrane-Fourier Transform Infrared Spectroscopy
W. Ketren, J. Wannapeera, Z. Heishun, A. Ryuichi, K. Toshiteru, M. Kouichi, O. Hideaki
-
Optical and Dielectric Properties of Self-Assembled 0D Hybrid Organic-Inorganic Insulator
S. Kassou, R. El Mrabet, A. Belaaraj, P. Guionneau, N. Hadi, T. Lamcharfi
-
On-Chip Aging Sensor Circuit Based on Phase Locked Loop Circuit
Ararat Khachatryan, Davit Mirzoyan
-
Iron(III)-Tosylate Doped PEDOT and PEG: A Nanoscale Conductivity Study of an Electrochemical System with Biosensing Applications
Giulio Rosati, Luciano Sappia, Rossana Madrid, Noemi Rozlòsnik
-
Annealing of the Contact between Graphene and Metal: Electrical and Raman Study
A. Sakavičius, A. Lukša, V. Nargelienė, V. Bukauskas, G. Astromskas, A. Šetkus
-
Microscopic Analysis of Interfacial Transition Zone of Cementitious Composites Prepared by Various Mixing Procedures
Josef Fládr, Jiří Němeček, Veronika Koudelková, Petr Bílý
-
Influence of Sodium Acetate on Electroless Ni-P Deposits and Effect of Heat Treatment on Corrosion Behavior
Y. El Kaissi, M. Allam, A. Koulou, M. Galai, M. Ebn Touhami
Conference venue information will be released soon.
Nanoscience and Nanometrology
Science of measurement at the nanoscale level
Nanomanufacturing
Nano coordinate measuring machine
Atomic force microscopy
X-ray absorption spectroscopy
X- ray diffraction
Small angle x-ray scattering
Scanning tunneling microscopy
Transmission electron microscopy
Capacitance spectroscopy
Polarization spectroscopy
Auger electron spectroscopy
Raman spectroscopy
Small angle neutron scattering
Scanning electron microscopy
Cyclic voltammetry
Linear sweep voltammetry
Nuclear magnetic resonance
Mössbauer spectroscopy
Fourier transform infrared spectroscopy
Photoluminescence spectroscopy
Electroluminescence spectroscopy
Differential scanning calorimetry
Secondary ion mass spectrometry
Cathodoluminescence spectroscopy
Electron energy loss spectroscopy
Energy dispersive x-ray spectroscopy
Four point probe and i-v technique
X-ray photoelectron spectroscopy
Scanning near-field optical microscopy
Single-molecule spectroscopy
Neutron diffraction
Interference microscopy
Laser interferometry
Abstracts/Full-Text Paper Submission Deadline |
|
September 03, 2024 |
Notification of Acceptance/Rejection |
|
September 17, 2024 |
Final Paper (Camera Ready) Submission & Early Bird Registration Deadline |
|
April 23, 2025 |
Conference Dates |
|
May 24-25, 2025 |