The International Research Conference Aims and Objectives
The International Research Conference is a federated organization dedicated to bringing together a significant number of diverse scholarly events for presentation
within the conference program. Events will run over a span of time during the conference depending on the number and length of the presentations.
With its high quality, it provides an exceptional value for students, academics and industry researchers.
International Conference on Metrology and Inspection
aims to bring together leading academic scientists, researchers and research scholars to exchange and share their experiences and research results on all aspects of
Metrology and Inspection.
It also provides a premier interdisciplinary platform for researchers, practitioners and educators to present and discuss the most recent innovations,
trends, and concerns as well as practical challenges encountered and solutions adopted in the fields of Metrology and Inspection.
Call for Contributions
Prospective authors are kindly encouraged to contribute to and help shape the conference through submissions of their research abstracts, papers and e-posters.
Also, high quality research contributions describing original and unpublished results of conceptual, constructive, empirical, experimental, or
theoretical work in all areas of Metrology and Inspection are cordially invited for presentation at the conference.
The conference solicits contributions of abstracts, papers and e-posters that address themes and topics of the conference, including figures, tables and references of
novel research materials.
Guidelines for Authors
Please ensure your submission meets the conference's strict guidelines for accepting scholarly papers.
Downloadable versions of the check list for
Full-Text Papers and
Abstract Papers.
Please refer to the
Paper Submission Guideline,
Abstract Submission Guideline and
Author Information
before submitting your paper.
Conference Proceedings
All submitted conference papers will be blind peer reviewed by three competent reviewers.
The peer-reviewed conference proceedings are indexed in the Open Science Index,
Google Scholar,
Semantic Scholar,
Zenedo,
BASE,
WorldCAT,
Sherpa/RoMEO,
and other index databases. Impact Factor Indicators.
Special Journal Issues
20. International Conference on Metrology and Inspection has teamed up with the Special Journal Issue on
Metrology and Inspection.
A number of selected high-impact full text papers will also be considered for the special journal issues.
All submitted papers will have the opportunity to be considered for this Special Journal Issue.
The paper selection will be carried out during the peer review process as well as at the conference presentation stage.
Submitted papers must not be under consideration by any other journal or publication.
The final decision for paper selection will be made based on peer review reports by the Guest Editors and the Editor-in-Chief jointly.
Selected full-text papers will be published online free of charge.
Conference Sponsor and Exhibitor Opportunities
The Conference offers the opportunity to become a conference sponsor or exhibitor.
To participate as a sponsor or exhibitor, please download and complete the
Conference Sponsorship Request Form.
Selected Papers
-
Evolution of Web Development Techniques in Modern Technology
Abdul Basit Kiani, Maryam Kiani
-
Lean Implementation: An Investigation in Successfully Adopting a Lean Philosophy
P. Ahern, D. Collery
-
Bridge Health Monitoring: A Review
Mohammad Bakhshandeh
-
Failure Analysis of a 304 Stainless Steel Flange Crack at Pipeline Transportation of Ethylene
Parisa Hasanpour, Bahram Borooghani, Vahid Asadi
-
Privacy Concerns and Law Enforcement Data Collection to Tackle Domestic and Sexual Violence
Francesca Radice
-
Static Analysis of Security Issues of the Python Packages Ecosystem
Adam Gorine, Faten Spondon
-
Cultural Policies, Globalisation of Arts, and Impact on Cultural Heritage: A Contextual Analysis of France
Nasser AlShawaaf, Soo Hee Lee
-
AI-Driven Cloud Security: Proactive Defense Against Evolving Cyber Threats
Ashly Joseph
-
Enhancing Hand Efficiency of Smart Glass Cleaning Robot through Generative Design Module
Pankaj Gupta, Amit Kumar Srivastava, Nitesh Pandey
-
Influence of Surface Area on Dissolution of Additively Manufactured Polyvinyl Alcohol Tablets
Seyedebrahim Afkhami, Meisam Abdi, Reza Baserinia
-
Uncertainty Multiple Criteria Decision Making Analysis for Stealth Combat Aircraft Selection
C. Ardil
-
Development of an Artificial Ear for Bone-Conducted Objective Occlusion Measurement
Yu Luan
-
Minimizing Mutant Sets by Equivalence and Subsumption
Samia Alblwi, Amani Ayad
-
Impact of Fly Ash-Based Geopolymer Modification on the High-Temperature Properties of Bitumen
Burak Yigit Katanalp, Murat Tastan, Perviz Ahmedzade, Çigdem Canbay Turkyilmaz, Emrah Turkyilmaz
-
Exploring Anti-Western Sentiment Among Arabs and Its Influence on Support for Russia in the Ukraine Conflict
Soran Tarkhani
Conference venue information will be released soon.
Measurement, analysis and testing processes and technologies
Evolution of techniques, advances in R&D and industrial applications
Metrology and precious measurement
Jigs and fixtures
Surface finish measurement
Linear and different angular measurement
Alignment testing of machine tools
Measurement, analysis and testing processes
Uncertainties, traceability
Inter-laboratory comparisons
Calibration
Verification
Training
Cost optimization
Certification
Metrology function
Measurement technics
Mass, force, flow and pressure
Dimensional, electricity
Time-frequency
Temperature
Hygrometry
Optics and photonics
Ionizing radiation
Acoustics
Chemical measures
Biological measures
Abstracts/Full-Text Paper Submission Deadline |
|
February 13, 2025 |
Notification of Acceptance/Rejection |
|
February 27, 2025 |
Final Paper (Camera Ready) Submission & Early Bird Registration Deadline |
|
July 12, 2026 |
Conference Dates |
|
November 11-12, 2026 |